Abstract: We propose an electrostatics-based placement algorithm for large-scale mixed-size circuits (ePlace-MS). ePlace-MS is generalized, flat, analytic and nonlinear. The density modeling method ...
Abstract: To assess the reliability of GaN power transistors, off-state leakage characteristic is measured for Schottky p-GaN gate HEMTs under negative gate biases. It is found that the drain leakage ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback