Efficiency and power density are persistent challenges in high-current applications, particularly as systems become more ...
Abstract: This brief introduces a current calibration circuit that is specifically designed for use in a column-parallel Dual-Ramp Single-Slope (DRSS) ADC. This circuit creates two current sources ...
Abstract: This article presents a novel fault diagnosis method for open-circuit faults of insulated gate bipolar transistors (IGBTs) and current sensor faults in three-phase sinusoidal pulsewidth ...
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