A version of Part 1 appeared in the Dec. 2011/Jan. 2012 issue of Test & Measurement World. See the PDF. In January 1979, Electronic Test published an article claiming that a single test circuit that ...

As AI technology and no-code automation tools continue to evolve, manual testing seems to be losing its edge. This perception may or may not align with reality, as multiple factors are impacting ...

In part 1 of this series, “Circuits test key op amp parameters,” we addressed some of the basic op amp (operational amplifier) tests such as V OS (offset voltage), CMRR (common-mode rejection ratio), ...